Microelectronics, Volume. 51, Issue 5, 636(2021)

An Externally Adjustable Foldback Current-Limit Circuit for LDO

LIU Lei, LUO Ping, ZHAO Zhong, LIU Junhong, and YANG Bingzhong
Author Affiliations
  • [in Chinese]
  • show less

    Based on a 0.18 μm BCD process, an externally adjustable foldback current-limit circuit for LDO was proposed. This new circuit had both current limiting and foldback functions. The current limiting part clamped the maximum output through a loop formed by current mirrors. The foldback part used a negative feedback loop formed by an error amplifier to generate a current foldback output current proportional to the output voltage. Compared with traditional current-limit structures, this new structure saved a lot of power consumption and protected the power MOSFET from being burnt. Compared with the traditional foldback structures, this structure could easily adjust the current limit and the foldback point by adjusting two external resistors to avoid the voltage regulator from latching up. At 1.2 V typical output, the simulation verification results of the LDO circuit showed that the current limit range was 215~350 mA, and the foldback voltage range was 450~900 mV while adjusting four different external resistance values. The power consumption during short-circuited region was reduced to 230 mW.

    Tools

    Get Citation

    Copy Citation Text

    LIU Lei, LUO Ping, ZHAO Zhong, LIU Junhong, YANG Bingzhong. An Externally Adjustable Foldback Current-Limit Circuit for LDO[J]. Microelectronics, 2021, 51(5): 636

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Nov. 26, 2020

    Accepted: --

    Published Online: Feb. 18, 2022

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.200552

    Topics