Chinese Journal of Lasers, Volume. 38, Issue 5, 508003(2011)

Testing the Criterion Wavefront Diffracted by Point Diffraction Interferometer

Shao Jing1,2、* and Ma Dongmei1
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  • 1[in Chinese]
  • 2[in Chinese]
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    A new method based on extended Nijboer-Zernike (ENZ) theory is proposed for testing the wavefront diffracted by a pinhole in the point diffraction interferometer (PDI). The principle of PDI is described and the phase retrieval algorithm based on ENZ is put forward. The way in expansion of the pupil function with Zernike polynomial is analysed. In the simulation experiment, deviation in the image part of the Zernike coefficients obtained from the retrieval result is less than 3×10-5, when singal-to-noise (SNR) is 55 dB with a 10-bit analog-to-digital conversion. The effect of noise and the analog-digital conversion is only involved, the result in this simulation experiment just proves that testing the wavefront diffracted by a pinhole with this method is possible.

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    Shao Jing, Ma Dongmei. Testing the Criterion Wavefront Diffracted by Point Diffraction Interferometer[J]. Chinese Journal of Lasers, 2011, 38(5): 508003

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    Paper Information

    Category: measurement and metrology

    Received: Dec. 6, 2010

    Accepted: --

    Published Online: May. 9, 2011

    The Author Email: Jing Shao (qunying12@163.com)

    DOI:10.3788/cjl201138.0508003

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