A new phase shifting profilometry based on single-shot acquisition is proposed. This method retains the phase shifting characteristics and high accuracy of traditional phase shifting profilometry (PSP), and can only captures one deformedpattern during real-time measurement. In traditional phase shifting profilometry, N (N>2) framesof the phase shifting sinusoidal gratingsare projected and N frames of the phase shifting deformedpatterns are captured, and the measurement accuracy is higher as N value increases. The method proposed in this paper only needs to project one sinusoidal grating and captureone deformed pattern while measuring, and the measurement accuracy can be improved by increasing the number of phase shifting, and the characteristics of single-shot acquisition can be guaranteed in both static measurement and real-time 3D measurement. In addition, the mathematical model of this method is more concise than that of the traditional PSP, and the wrapped phase obtained is only related to the height of the object itself, without phase calculation and demodulation of the reference plane and the object to be measured. Compared with other single-shot measurement methods, the accuracy is higher, and effectively avoids the spectrum loss caused by direct filtering of the deformed pattern’s spectrum, or the problems of color aliasing and limited dynamic range caused by other real-time measurements based on PSP. Simulation and experimental results show the feasibility and effectiveness of the proposed method.