The Goos-Hanchen (GH) shift that occurs in single-interface reflection and the frustrate-total-internal reflection is only of the order of the wavelength. The smallness of the shift for optical wavelength impedes its direct measurement in experiments. In this paper, the resonance-enhanced GH shift is investigated for totally reflected light beam from a thin-film coated prism at incidence angle less than, but close to the critical angle between the prism-film interfaces. It is shows that the GH shift oscillates with respect to the thickness of the thin film. Its maxima are approximately proportional to the thickness of the thin film, and the magnitude of the shift can be enhanced by a factor of 102~103 in comparison with the usual one. The GH shift can be modulated by changing the angle of incidence or the thickness of the thin film. Finally, the thickness of the film is required to satisfy a condition that is necessary to retain beam's profile in total reflection.