Chinese Journal of Lasers, Volume. 34, Issue 11, 1594(2007)

Repair Effects and Damage of Cell of Wheat Seedlings Exposed to Enhanced Ultraviolet-B Radiation by He-Ne Laser

[in Chinese]1、*, [in Chinese]1,2, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    The seedlings of wheat (Jinmai 8) were exposed to He-Ne laser with 5 mW·mm-2 power density, enhanced ultraviolet-B radiation (UV-B) (10.08 kJ·m-2·d-1) and the combination of He-Ne laser and enhanced UV-B radiation respectively for 5 days. Changes about production rate of superoxide anion, malondialdehyde (MDA) content, ultraviolet absorption value and conductance of exosmic fluid of wheat seedlings, content of soluble protein and chlorophyll were measured to analyze the repair role of He-Ne laser irradiation. The results showed that He-Ne laser irradiation on the wheat seedlings led to the decrease of the production rate of superoxide anion, MDA content and ultraviolet absorption value and conductance of exosmic fluid of wheat seedlings. The content of soluble protein and chlorophyll increased to 76.66% and 1.79 mg/g respectively. It suggested that those changes about production rate of superoxide anion, MDA, ultraviolet absorbing value and conductance, soluble protein and chlorophyll were related to the repair capacity of the wheat seedings. Therefore, the damage of wheat seedlings induced by enhanced UV-B radiation can be repaired partly by He-Ne laser.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Repair Effects and Damage of Cell of Wheat Seedlings Exposed to Enhanced Ultraviolet-B Radiation by He-Ne Laser[J]. Chinese Journal of Lasers, 2007, 34(11): 1594

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: biomedical photonics and laser medicine

    Received: Jan. 16, 2007

    Accepted: --

    Published Online: Nov. 12, 2007

    The Author Email: (hhwrsl@yahoo.com.cn)

    DOI:

    Topics