New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 30, Issue 2, 167(2003)

[in Chinese]^*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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A novel method of measuring absolute X ray wavelengths using an auxiliary diaphragm attached to the planar crystal, which can accurately determine wavelengths without any reference line and any information or special position.

Keywords

auxiliary diaphragm laser plasma planar crystal spectrometer X-ray spectroscopy optical technique and instrument

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability[J]. Chinese Journal of Lasers, 2003, 30(2): 167

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Paper Information

Category: measurement and metrology

Received: Dec. 12, 2001

Accepted: --

Published Online: Jun. 27, 2006

The Author Email: (liuzhi@siom.ac.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology