Chinese Journal of Lasers, Volume. 39, Issue 8, 807003(2012)

Reflected-Intensity Distribution of a Thin-Film Filter with Oblique Incidence of a Gaussian Beam Under-Parallel Case

Yu Kan1、*, Huang Dexiu1,2, Yin Juanjuan1, and Bao Jiaqi1
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  • 1[in Chinese]
  • 2[in Chinese]
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    Based on the multi-beam interference principle, a Gaussian beam reflected-intensity expression on a non-parallel angle-tuned thin-film filter in oblique incidence is derived. The influence of the reflected-intensity distribution with different incident angles, especially with different wedge angles of the non-paralleled thin-film filter is analyzed theoretically. Calculation and experimental results show that the reflected-intensity distribution, reflected-peak and the isolation degree are influenced by the wedge angle, incident angle and polarity of the wedge angle. In order to get stable reflected-characteristics and high isolation degree, the parallelism of the angle-tuned thin-film filter should be improved in fabrication or the polarity of the wedge angle in oblique incidence should be negative.

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    Yu Kan, Huang Dexiu, Yin Juanjuan, Bao Jiaqi. Reflected-Intensity Distribution of a Thin-Film Filter with Oblique Incidence of a Gaussian Beam Under-Parallel Case[J]. Chinese Journal of Lasers, 2012, 39(8): 807003

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    Paper Information

    Category: materials and thin films

    Received: Mar. 29, 2012

    Accepted: --

    Published Online: Jul. 17, 2012

    The Author Email: Kan Yu (onlyfish@126.com)

    DOI:10.3788/cjl201239.0807003

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