For micro-satellites in orbit, Single Event Latchup(SEL) is one of the most destructive single event effects. The SEL results in damage to the device, even failure to the mission. Firstly, the mechanism of SEL was described as well as the existing anti-SEL technology. Protective measures for SEL were put forward. An restorable anti-SEL power interface protection circuit was proposed for protection to the device in the satellite from SEL and overcurrent. By use of the pulse laser technology, a chip with experience in space was tested and analyzed. Experimental results show that the circuit can accurately detect the occurrence of SEL and remove the SEL effect, to ensure the system is stable and reliable.