Acta Optica Sinica, Volume. 19, Issue 11, 1581(1999)
A Device for Testing Spectral Responsivity of Semiconductor Photodetector
The testing of spectral responsivity of semiconductor photo detector is discussed. A device used for testing spectral responsivity with wavelength ranged from 0.4～1.1 μm is developed. It can be used to test relative spectral responsivity, absolute spectral responsivity and quantum efficiency, and the effect of instability of source can be eliminated. The testing results are compared.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Device for Testing Spectral Responsivity of Semiconductor Photodetector[J]. Acta Optica Sinica, 1999, 19(11): 1581
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