Opto-Electronic Engineering, Volume. 40, Issue 2, 40(2013)

Coordinate Measuring Inspection and Inverse Analysis on Ellipsoidal Surface Reflector

Lü Shaobo*, WANG Yinhe, ZHANG Yongxi, LIU Xinhua, SUN Zhaoyang, and YIN Xiaojun
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  • [in Chinese]
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    Two ellipsoidal surface reflectors, one was made by grinding and the other by molding, were detected using coordinate measuring machine. Contrasting to their profile line, a deviation distribution curve with peaks and valley on the first reflector and a linear deviation distribution on the other one are acquired. TracePro was used to simulate luminance of their reflecting spot and a reflecting effect ratio of 92% comparing between the two reflectors is obtained. Optical imaging method was used to inspect the reflected light spot and the result shows that bright and dim rings appear alternately in the reflected spot of the grinding reflector, and the other one gets a cloud-like reflected light spot.

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    Lü Shaobo, WANG Yinhe, ZHANG Yongxi, LIU Xinhua, SUN Zhaoyang, YIN Xiaojun. Coordinate Measuring Inspection and Inverse Analysis on Ellipsoidal Surface Reflector[J]. Opto-Electronic Engineering, 2013, 40(2): 40

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    Paper Information

    Category:

    Received: Aug. 31, 2012

    Accepted: --

    Published Online: Mar. 5, 2013

    The Author Email: Shaobo Lü (lvshaobo@hb-optical.com)

    DOI:10.3969/j.issn.1003-501x.2013.02.006

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