Highly oriented Pb(Zr 0.55 Ti 0.45 )O 3(PZT) ferroelectric thin films have been grown on an epitaxial YBCO/LaAlO 3(100) single crystal substrate using pulsed laser deposition (XeCl excimer, λ=308 nm,τ=28 ns). The YBCO layer provides a seed for PZT growth and can also act as an electrode for the PZT thin films. These heterostructures were characterized using X ray diffraction, and the surface morphologies were observed using SEM. The PZT thin film showed a remnant polarization of 21 μC/cm2 and a coercive field of 65 kV/cm. The effects of processing parameters on structures and surface morphoiogies are discussed.