OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 21, Issue 2, 11(2023)

Three-Dimensional Measurement for Highly Reflective Object

LI Ming-hang, CAO Yi-ping, WU Hai-tao, LI Zhi-chao, WANG Lin-xi, and LI Hong-mei
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    In measuring highly reflective object, fringe projection profilometry (FPP) may cause overexposure of the surface, resulting in missing phase data in the corresponding area. A three-dimensional (3D) measurement method is proposed for the highly reflective object. Only a fixed grating is projected onto the highly reflective object. Two deformed patterns in which highly reflective areas do not overlap each other are captured at different positions with the object’s straight-line movement in the projected region. Subsequently, the 3D shape of the object at these two positions from the two deformed patterns is partially reconstructed separately using single-shot computer-generated Moiré profilometry (CGMP) proposed in our laboratory. Finally, the pixel matching, point cloud registration and fusion are used to obtain the object’s complete 3D shape. With no additional equipment and using only one grating, this method achieves higher accuracy than conventional monocular adaptive fringe projection algorithms and improves the measurement practicality. Experimental results show the feasibility and effectiveness of the proposed method.

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    LI Ming-hang, CAO Yi-ping, WU Hai-tao, LI Zhi-chao, WANG Lin-xi, LI Hong-mei. Three-Dimensional Measurement for Highly Reflective Object[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2023, 21(2): 11

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    Paper Information

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    Received: Aug. 10, 2022

    Accepted: --

    Published Online: Apr. 15, 2023

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    CSTR:32186.14.

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