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Chinese Journal of Lasers, Volume. 36, Issue 5, 1175(2009)

Applicability Problem in Characterization of Femtosecond Pulses with Spectral Phase Interferometry for Direct Electric-Field Reconstruction

Liu Jun1、*, Wen Jinhui1, Zhang Yanwei1, Jiao Zhongxing1, Lei Liang2, Huang Zhiling1, Chen Zhifeng1, and Lai Tianshu1
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    Liu Jun, Wen Jinhui, Zhang Yanwei, Jiao Zhongxing, Lei Liang, Huang Zhiling, Chen Zhifeng, Lai Tianshu. Applicability Problem in Characterization of Femtosecond Pulses with Spectral Phase Interferometry for Direct Electric-Field Reconstruction[J]. Chinese Journal of Lasers, 2009, 36(5): 1175

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    Paper Information

    Category: Measurement and metrology

    Received: Aug. 6, 2008

    Accepted: --

    Published Online: May. 22, 2009

    The Author Email: Jun Liu (liujun19841017@yahoo.com.cn)

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology