Jamin lateral shearing interferometer is very useful in wavefront measurement, especially for the white light. To improve the performance, a phase shifting Jamin lateral shearing interferometer is proposed. The interferometer is formed by inserting polarizers, a quarter-wave plate and an analyzer in the Jamin lateral shearing interferometer. The shearing interference is combined with the phase shifting with a simple configuration. With phase shifting interferograms, the precision of the interferometer can be improved. The interferometer is kept as an equal optical path system. It still suits the wavefront measurement of the white light. In experiments, phase-shifting interferograms are obtained by rotating the analyzer. The usefulness of the interferometer is verified.