A new quality map for quality-guided phase unwrapping

Yuangang Lu; Xiangzhao Wang; Xianghong Zhong; Guotian He; Yingming Liu; Defeng Zheng

Chinese Optics Letters, Volume. 2, Issue 12, 12698(2004)

Yuangang Lu^1,2、*, Xiangzhao Wang¹, Xianghong Zhong¹, Guotian He^1,2, Yingming Liu^1,2, and Defeng Zheng^1,2

¹Information Optics Laboratory, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

²Graduate School of the Chinese Academy of Sciences, Beijing 100039

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A new quality map for quality-guided phase unwrapping is presented. The quality map is derived from the wrapped phase map directly and can reflect phase quality accurately. It is demonstrated that the proposed quality map is a good phase-quality indicator, with which the quality-guided unwrapping algorithm can retrieve a reliable phase profile.

Keywords

070.5010 120.5050 100.0100 image processing pattern recognition and feature extraction phase measurement

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Yuangang Lu, Xiangzhao Wang, Xianghong Zhong, Guotian He, Yingming Liu, Defeng Zheng, "A new quality map for quality-guided phase unwrapping," Chin. Opt. Lett. 2, 12698 (2004)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Apr. 19, 2004

Accepted: --

Published Online: Jun. 6, 2006

The Author Email: Yuangang Lu (lu_yuangang@siom.ac.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology