Journal of Synthetic Crystals, Volume. 50, Issue 1, 66(2021)

Light Injection Study of N-TOPCon Silicon Solar Cells on Annealing Synergies

WEI Kaifeng*, LIU Dawei, NI Yufeng, ZHANG Ting, LIU Junbao, ZHANG Tianjie, and YANG Lu
Author Affiliations
  • [in Chinese]
  • show less

    After printing and sintering of the N type TOPCon (Tunnel Oxide Passivating Contacts) solar cells, the efficiency was improved significantly by light injection, which mainly manifested in the improvement of Voc and FF. The mechanism is to improve the passivation performance through adjusting the Fermi energy level by temperature and light intensity and controlling the total amount and valence state of H. The quality of the passivation film, the doping concentration of silicon substrate and the temperature during the light injection annealing process have great influence on the efficiency of the light injection annealing process. The experiments show that the lower the conversion efficiency of the battery is, the higher the efficiency is after light injection. The higher the conversion efficiency is, the smaller the defect will be, and the efficiency has almost no gain after the light injection annealing process. In addition, concentric circles can be eliminated obviously after light injection annealing process. This paper mainly studies the effects of temperature, light intensity, substrate resistivity, front surface metal contact area and poly-Si thickness on the efficiency of light injection annealing process.

    Tools

    Get Citation

    Copy Citation Text

    WEI Kaifeng, LIU Dawei, NI Yufeng, ZHANG Ting, LIU Junbao, ZHANG Tianjie, YANG Lu. Light Injection Study of N-TOPCon Silicon Solar Cells on Annealing Synergies[J]. Journal of Synthetic Crystals, 2021, 50(1): 66

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 31, 2020

    Accepted: --

    Published Online: Apr. 15, 2021

    The Author Email: WEI Kaifeng (weikaifeng@spic.com.cn)

    DOI:

    CSTR:32186.14.

    Topics