Currently, the detection of blind pixel in infrared detectors is typically conducted using the national standard method, Measuring Methods for Parameters of Infrared Focal Plane Arrays (GB/T 17444—2013). However, this method may result in inaccuracies in identifying blind pixels. To enhance the accuracy of blind pixels detection in infrared detectors, a blind pixel detection method based on the surface difference value and noise is proposed based on the national standard method. First, the causes of misjudgment associated with the national standard method are examined. Next, two surfaces are approximately fitted using effective pixel data, and the difference between these surfaces is used to establish specific dead pixel judgment criteria for individual pixels, enabling precise selection of dead pixels. Furthermore, by analyzing noise within infrared images, overheated pixels are also detected. The combined results of detected dead and overheated pixels provide the total number of blind pixels. Finally, comparative experiments involving various blind pixel detection methods demonstrate that the proposed method achieves a higher detection accuracy than the national standard method.