Chinese Journal of Lasers, Volume. 17, Issue s1, 158(1990)
Theoretical and experimental studies on active monitoring of antireflection coating of semiconductor laser diodes
The dependence of the output power and the spectral pattern of a semiconductor laser diode biased below the threshold on the reflectivity of the diode facet has been studied theoretically and experimentally. This dependence has provided the basis for actively monitoring the antireflection coating on the diode. Preparation of AR coating on the diode facet and the measurement of the diode parameters have verified the theoretical prediction.
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Li Dayi, Lu Yucun, Chen Jianguo. Theoretical and experimental studies on active monitoring of antireflection coating of semiconductor laser diodes[J]. Chinese Journal of Lasers, 1990, 17(s1): 158
Paper Information
Category: materials and thin films
Received: Jun. 23, 1989
Accepted: --
Published Online: Oct. 12, 2012
The Author Email:
CSTR:32186.14.
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