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Chinese Journal of Lasers, Volume. 34, Issue 6, 825(2007)

Reflectance Spectrum Measurement of Multilayer Film by Spectroscopic Optical Coherence Tomography

[in Chinese]1,2,3、*, [in Chinese]3, and [in Chinese]3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Article index updated: Mar. 11, 2025

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    [in Chinese], [in Chinese], [in Chinese]. Reflectance Spectrum Measurement of Multilayer Film by Spectroscopic Optical Coherence Tomography[J]. Chinese Journal of Lasers, 2007, 34(6): 825

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    Paper Information

    Category: measurement and metrology

    Received: Oct. 20, 2006

    Accepted: --

    Published Online: Jun. 8, 2007

    The Author Email: (chenyh_suda@126.com)

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology