Journal of Semiconductors
Co-Editors-in-Chief
Shushen Li
CN
11-5781/TN
ISSN
1674-4926
Impact Factor
Google Scholar h5-index
Frequency
Monthly issues
Liu Wenrong, Li Xinyang, Zhang Changwen, and Yan Shishen
Apr. 25, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/4/042501
Janus VXY monolayers with tunable large Berry curvature
Huang Menglin, Zheng Zhengneng, Dai Zhenxing, Guo Xinjing, Wang Shanshan, Jiang Lilai, Wei Jinchen, and Chen Shiyou
Apr. 25, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/4/042101
DASP: Defect and Dopant ab-initio Simulation Package
Wu Xiaomei, Ke Xiaoxing, and Sui Manling
Apr. 25, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/4/041106
Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors
Zhao Peili, Li Lei, Chen Guoxujia, Guan Xiaoxi, Zhang Ying, Meng Weiwei, Zhao Ligong, Li Kaixuan, Jiang Renhui, Jia Shuangfeng, Zheng He, and Wang Jianbo
Apr. 25, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/4/041105
Structural evolution of low-dimensional metal oxide semiconductors under external stress
Fang Zhen, Liu Yao, Song Chengyi, Tao Peng, Shang Wen, Deng Tao, Zeng Xiaoqin, and Wu Jianbo
Apr. 25, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/4/041104
In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processes