Infrared and Laser Engineering, Volume. 34, Issue 4, 397(2005)

Interferogram region spreading technology in spatial domain

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    References(4)

    [1] [1] Bone D J,Bachor H A,Sandeman R J.Fringe pattern analyses using a 2 -D Fourier transform [J].Applied Optics, 1986,25:1653-1660.

    [2] [2] Rodier C, Rodier F.Interferogram analysis using Fourier transform technique[J].Applied Optics, 1987,26(9):1668-1673.

    [3] [3] Talamonti J J,Kay R B,Krebs D J.Numerical model estimating the capabilities and limitations of the fast Fourier transform technique in absolute interferomet[J].Applied Optics, 1996,35(13);2182-2191.

    [6] [6] Gerchberg R W. Supe-resolution through error energy reduction [J].Opt Acta, 1974,21: 709-720.

    CLP Journals

    [1] Ge Jinman, Su Junhong. Processing Technology of Interferogram of Thin Film Thickness Measurement[J]. Chinese Journal of Lasers, 2009, 36(s2): 252

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    [in Chinese], [in Chinese], [in Chinese]. Interferogram region spreading technology in spatial domain[J]. Infrared and Laser Engineering, 2005, 34(4): 397

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    Paper Information

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    Received: May. 14, 2005

    Accepted: Jun. 16, 2005

    Published Online: May. 25, 2006

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