Acta Photonica Sinica, Volume. 34, Issue 8, 1149(2005)

1/f Noise of GaAlAs IREDs Over a Wide Range of Bias Currents

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    References(10)

    [1] [1] Shi J W,Sun J E,Ma J.An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers.Microelectronics Reliability, 1994,34(7):1261~1267

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    [10] [10] Bao J L,Zhuang Y Q,Du L,et al.Noise testing and analyzing system of electronic device based on virtual instrumentation.Chinese Journal of Scientific Instruments,2004,3(supplement):351~353

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 1/f Noise of GaAlAs IREDs Over a Wide Range of Bias Currents[J]. Acta Photonica Sinica, 2005, 34(8): 1149

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    Paper Information

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    Received: Feb. 28, 2005

    Accepted: --

    Published Online: Jun. 12, 2006

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