Infrared and Laser Engineering, Volume. 50, Issue 9, 20200425(2021)

Cat eye echo characteristics of optical imaging system in CCD damage process

Shijie Chen, Chunhui Niu, Xiaoying Li, and Yong Lv
Author Affiliations
  • School of Instrument Science and Opto Electronics Engineering, Beijing Information Science & Technology University, Beijing 100192, China
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    Figures & Tables(8)
    CCD point damage, line damage, full target damage imaging images
    Change curve of cat eye echo power and degree of polarization under different CCD damage states
    Microscopic images (a)-(c) and contour images (d)-(e) of damage sites under different damage states
    Relation curves between the polarization degree of echo scattering and the surface roughness of target for cat’s eye of different materials
    Cat eye echo power (a) and degree of polarization (b) vary with the number of pulses
    Surface morphology of different damage sites
    • Table 1. RMS height measurement results of material surface

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      Table 1. RMS height measurement results of material surface

      RMS height Sq/μm Point damageLine damageFull target damage
      The first group4.1323.9194.006
      The second group3.8954.0363.940
    • Table 2. Root mean square height measurement results of material surface

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      Table 2. Root mean square height measurement results of material surface

      ItemPulse number
      012345678
      RMS height Sq/μm 4.1350.0120.0070.4910.4400.3700.3520.5160.650
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    Shijie Chen, Chunhui Niu, Xiaoying Li, Yong Lv. Cat eye echo characteristics of optical imaging system in CCD damage process[J]. Infrared and Laser Engineering, 2021, 50(9): 20200425

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    Paper Information

    Category: Lasers & Laser optics

    Received: Dec. 17, 2020

    Accepted: --

    Published Online: Oct. 28, 2021

    The Author Email:

    DOI:10.3788/IRLA20200425

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