Photonics Research, Volume. 2, Issue 4, B35(2014)

Optical length-change measurement based on an incoherent single-bandpass microwave photonic filter with high resolution

Ye Deng, Ming Li*, Ningbo Huang, Hui Wang, and and Ninghua Zhu
Author Affiliations
  • State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
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    Figures & Tables(5)
    Schematic showings of the proposed optical length measurement technique based on a single-bandpass MPF. SLED, superluminescent LED; TOF, tunable optical filter; Pol, polarizer; PC, polarization controller; PBS, polarization beam splitter; PBC, polarization beam combiner; PolM, polarization modulator; DCF, dispersion compensation fiber; PD, photodetector; VNA, vector network analyzer.
    Basic implementation principle of the proposed MPF-based approach for measuring optical length change.
    Measured optical spectrum of the lightwave output from a SLED cascaded with a TOF.
    Measured frequency response of the MPF along with the change of optical length. (a) Center frequency is tuned ranging from 2 to 14 GHz. (b) Center frequency is tuned around 10 GHz.
    Relationship between the center frequency of the MPF and the optical length change.
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    Ye Deng, Ming Li, Ningbo Huang, Hui Wang, and Ninghua Zhu. Optical length-change measurement based on an incoherent single-bandpass microwave photonic filter with high resolution[J]. Photonics Research, 2014, 2(4): B35

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    Paper Information

    Special Issue: MICROWAVE PHOTONICS

    Received: Apr. 2, 2014

    Accepted: Apr. 29, 2014

    Published Online: Sep. 15, 2014

    The Author Email: Ming Li (ml@semi.ac.cn)

    DOI:10.1364/PRJ.2.000B35

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