Opto-Electronic Engineering, Volume. 42, Issue 8, 14(2015)

Precise Measurement of Flatness for Large Diameter Narrow Zone Annular Plane

CHEN Baogang*... SHAO Liang and LI Jianfeng |Show fewer author(s)
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    References(1)

    [2] [2] MALACARA D. Optical Shop Testing [M]. New York: John Wiley&Sons, 1992: 126-143.

    CLP Journals

    [1] HE Wenyan, CAO Xuedong, KUANG Long, ZHANG Peng. A Preliminary Based on Structured-light for Flatness Measurement of Large Annular Planes[J]. Opto-Electronic Engineering, 2016, 43(11): 7

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    CHEN Baogang, SHAO Liang, LI Jianfeng. Precise Measurement of Flatness for Large Diameter Narrow Zone Annular Plane[J]. Opto-Electronic Engineering, 2015, 42(8): 14

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    Paper Information

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    Received: Nov. 11, 2014

    Accepted: --

    Published Online: Sep. 8, 2015

    The Author Email: Baogang CHEN (cbg0813@163.com)

    DOI:10.3969/j.issn.1003-501x.2015.08.003

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