Chinese Journal of Quantum Electronics, Volume. 40, Issue 5, 780(2023)
Research on performance test method and test platform of ultraviolet imager
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Yongling LU, Zhen WANG, Chengbo HU, Jinggang YANG, Hang LU. Research on performance test method and test platform of ultraviolet imager[J]. Chinese Journal of Quantum Electronics, 2023, 40(5): 780
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Received: Aug. 11, 2021
Accepted: --
Published Online: Nov. 24, 2023
The Author Email: LU Yongling (15105182955@163.com)