Opto-Electronic Engineering, Volume. 42, Issue 9, 66(2015)

Analysis and Implementation of Toroidally Bent Crystal for X-ray Imaging Technology

SHI Jun*... PENG Diyong and XIAO Shali |Show fewer author(s)
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    References(14)

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    [4] [4] Reinke M L, Podpaly Y A, Bitter M, et al. X-ray imaging crystal spectroscopy for use in plasma transport research [J]. Review of Scientific Instruments(S0034-6748), 2012, 83(11): 113504-1-12.

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    [7] [7] KochJ A, Agliskiy Y, Brown C, et al. 4.5 and 8-keV emission and absorption x-ray imaging using spherically bent quartz 203 and 211 crystals invited [J]. Review of Scientific Instruments(S0034-6748), 2003, 74(3): 2130-2135.

    [8] [8] Podoroy S G, Nazarkin A, Forster E, et al. An optimized two crystal arrangement for X-ray optics [J]. Optics Communications (S0030-4018), 2005, 259: 696–699.

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    SHI Jun, PENG Diyong, XIAO Shali. Analysis and Implementation of Toroidally Bent Crystal for X-ray Imaging Technology[J]. Opto-Electronic Engineering, 2015, 42(9): 66

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    Paper Information

    Received: Sep. 15, 2014

    Accepted: --

    Published Online: Feb. 2, 2016

    The Author Email: Jun SHI (shijun@cqu.edu.cn)

    DOI:10.3969/j.issn.1003-501x.2015.09.011

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