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Laser & Optoelectronics Progress, Volume. 53, Issue 2, 23101(2016)

Structural Analysis of GexAsySe1-x-y Chalcogenide Glass Thin-Films by Raman Spectroscopy

Li Chenghan*, Wang Li, Gan Yulin, and Su Xueqiong
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    Li Chenghan, Wang Li, Gan Yulin, Su Xueqiong. Structural Analysis of GexAsySe1-x-y Chalcogenide Glass Thin-Films by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(2): 23101

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    Paper Information

    Category: Thin Films

    Received: Jul. 16, 2015

    Accepted: --

    Published Online: Dec. 25, 2015

    The Author Email: Chenghan Li (lichenghan11@163.com)

    DOI:10.3788/lop53.023101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology