Acta Optica Sinica, Volume. 23, Issue 8, 984(2003)

Analysis of Optical Property for Several Ultraviolet Thin Film Materials

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    Some single layer films of different materials used in the ultraviolet region, which include oxide and fluoride, have been made on the fused silica substrate by resistive heating evaporation or electron beam bombardment technique. According to their transmissivity in 200~2000 nm, dispersion curves of these materials′ refractive index n and extinction coefficient k are obtained. Then their band gap through Tauc plot method and cut off wavelengths are got.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of Optical Property for Several Ultraviolet Thin Film Materials[J]. Acta Optica Sinica, 2003, 23(8): 984

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    Paper Information

    Category: Thin Films

    Received: Jun. 28, 2002

    Accepted: --

    Published Online: Jun. 27, 2006

    The Author Email: (seajing@opfilm.com)

    DOI:

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