Influence of Tm3+ ions on the amplification of Ho3+:5I7→5I8 transition in fluoride glass modified by Al(PO3)3 for applications in mid-infrared optics

Fangwei Qi; Feifei Huang; Tao Wang; Ruoshan Lei; Junjie Zhang; Shiqing Xu; Long Zhang

doi:10.3788/COL201715.051604

Chinese Optics Letters, Volume. 15, Issue 5, 051604(2017)

Influence of Tm³⁺ ions on the amplification of Ho³⁺:⁵I₇→⁵I₈ transition in fluoride glass modified by Al(PO₃)₃ for applications in mid-infrared optics

Fangwei Qi¹, Feifei Huang^1、*, Tao Wang¹, Ruoshan Lei¹, Junjie Zhang¹, Shiqing Xu¹, and Long Zhang^1,2

Author Affiliations

¹College of Materials Science and Engineering, China Jiliang University, Hangzhou 310018, China

²Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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Figures & Tables(8)

Fig. 1. DSC curve of the AYF glass with 5 mol% Al(PO3)3 introduction. Raman spectrum in the 100–1200 cm−1 range of undoped RE ions AYF glass with Al(PO3)3 introduction.

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Fig. 2. Absorption spectra of Tm3+ and Ho3+ singly doped and codoped samples. The inset is the transmittance spectrum of the sample.

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Fig. 3. Fluorescence spectra of Tm3+/Ho3+ codoped AYF glass modified by Al(PO3)3 with (a) different Ho3+ concentrations and (b) different Tm3+ concentrations. (c) The inset shows the energy level scheme of the Tm3+/Ho3+ system. ETU, ET upconversion.

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Fig. 4. (a) decay curves of Ho3+ in the HT1-4 samples, where the Ho3+ concentration is fixed at 0.2 mol% and (b) ET efficiencies from Tm3+ to Ho3+ in the TH1-4 samples.

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Fig. 5. Absorption cross section and emission cross section of the Ho3+:I85→I75 transition in the HT4 sample at the 2.0 μm region. The inset shows the products of the emission cross section and measured decay lifetime (σemi×τ) in the HT1-4 samples.

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Table 1. J-O Parameters Ωλ of Ho3+ in Various Glasses

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Table 1. J-O Parameters Ωλ of Ho3+ in Various Glasses

$Ω_{λ} (\times 10^{- 20} {cm}^{2})$	$Ω_{2}$	$Ω_{4}$	$Ω_{6}$	$Ω_{4} / Ω_{6}$	Reference
Fluoride	1.86	1.90	1.32	1.43	[29]
Phosphate	5.60	2.72	1.87	1.45	[29]
Silicate	5.84	2.38	1.75	1.36	[30]
AYF- $Al ({PO}_{3})_{3}$	$2.22 \pm 0.02$	$3.85 \pm 0.04$	$1.88 \pm 0.02$	2.04	Present
$δ_{rms}$		$0.18 \times 10^{- 6}$

Table 2. Predicted Spontaneous Transition Probability (A), Total Spontaneous Transition Probability (ΣA), Branching Ratios (β), and Radiative Lifetimes (τrad) of AYF Glass Modified by Al(PO3)3 for Various Selected Excited Levels of Ho3+

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Table 2. Predicted Spontaneous Transition Probability (A), Total Spontaneous Transition Probability (ΣA), Branching Ratios (β), and Radiative Lifetimes (τrad) of AYF Glass Modified by Al(PO3)3 for Various Selected Excited Levels of Ho3+

Transition	$λ$ (nm)	$A (s^{- 1})$	$Σ A (s^{- 1})$	$β$	$τ$ (ms)
${}^{5}{I_{7}} \to {}^{5}{I_{8}}$	1944	118.74	$118.74 \pm 0.1$	$100.00 % \pm 0.2 %$	8.42
${}^{5}{I_{6}} \to {}^{5}{I_{8}}$	1152	215.09	254.46	84.53%	3.93
${}^{5}{I_{7}}$	2810	39.37		15.47%
${}^{5}{I_{5}} \to {}^{5}{I_{8}}$	887	81.16	204.12	39.76%	4.90
${}^{5}{I_{7}}$	1631	107.73		52.78%
${}^{5}{I_{6}}$	3890	15.23		7.46%
${}^{5}{I_{4}} \to {}^{5}{I_{8}}$	757	10.95	111.26	9.84%	8.99

Table 3. σemi of 2.0 μm of Ho3+ in Various RE-Ion-Doped Glasses

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Table 3. σemi of 2.0 μm of Ho3+ in Various RE-Ion-Doped Glasses

Ions	Glass	$σ_{emi} (10^{- 21} {cm}^{- 2})$	Reference
${Tm}^{3 +} / {Ho}^{3 +}$	$AYF - Al {({PO}_{3})}_{3}$	7.60	Present work
	Fluorophosphate	6.15	[31]
	Silicate	3.07	[37]
${Yb}^{3 +} / {Ho}^{3 +}$	Fluorophosphate	4.53	[20]
	Silicate	5.05	[38]
${Yb}^{3 +} / {Tm}^{3 +} / {Ho}^{3 +}$	Phosphate	4.21	[39]
	Fluorophosphate	5.50	[40]

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Fangwei Qi, Feifei Huang, Tao Wang, Ruoshan Lei, Junjie Zhang, Shiqing Xu, Long Zhang. Influence of Tm³⁺ ions on the amplification of Ho³⁺:⁵I₇→⁵I₈ transition in fluoride glass modified by Al(PO₃)₃ for applications in mid-infrared optics[J]. Chinese Optics Letters, 2017, 15(5): 051604

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Paper Information

Category: Materials

Received: Dec. 12, 2016

Accepted: Feb. 17, 2017

Published Online: Jul. 23, 2018

The Author Email: Feifei Huang (huangfeifei@cjlu.edu.cn)

DOI:10.3788/COL201715.051604

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology