Optics and Precision Engineering, Volume. 15, Issue 12, 1886(2007)

Broadband aperiodic Mo/Si multilayer polarization elements for EUV region

References(6)

[1] [1] WANG Z S.WANG H C,ZHU J T,et al..Broad angular multilayer analyzer for soft X-rays[J].Optics Express,2006,14(6):2533-2538.

[2] [2] WANG H C,ZHU J T,WANG Z S,et al..Broadband Mo/Si multilayer analyzer for 15-17 nm wavelength range[J].Thin Solid Films,2006,515:2523-2526.

[3] [3] KIM D E,LEE S M,JEON I.Transmission characteristics of multiayer structure in the soft X-ray spectral region and its application to the design of quarter-wave plates at 13 and 4.4 nm[J].J.Vac.Sci.Technol.A,1999,17:398-402.

[4] [4] KORTRIGNT J B.Polarization properties of multilayers in the EUV and soft X-ray[J].SPIE,1993,2010:160-167.

[5] [5] KIMURA H,KINOSHITA T,SUZUKI S,et al..Polarization characteristic of synchrotron by means of rotatinganalyzer ellipsometry using soft X-ray multilayer[J].SPIE,1993,2010:37-44.

[6] [6] YAMAMOTO M.Polarimetry with use of soft X-rays multilayers[J].SPIE,1993,2010:152-159.

CLP Journals

[1] ZHANG Li-chao. Calibration of deposition rates of multilayer coatings by sputtering depositions[J]. Optics and Precision Engineering, 2010, 18(12): 2530

[2] Bai Liang, Zhu Jingtao, Xu Jing, Huang Qiushi, Wu Wenjuan, Wang Xiaoqiang, Wang Zhanshan, Chen Lingyan. Multilayer Film Reflective Mirror at 30.4 nm[J]. Acta Optica Sinica, 2009, 29(9): 2615

Tools

Get Citation

Copy Citation Text

. Broadband aperiodic Mo/Si multilayer polarization elements for EUV region[J]. Optics and Precision Engineering, 2007, 15(12): 1886

Download Citation

EndNote(RIS)BibTexPlain Text
Save article for my favorites
Paper Information

Category:

Received: Aug. 20, 2007

Accepted: --

Published Online: Jul. 8, 2008

The Author Email:

DOI:

Topics