[9] [9] J. Hynecek. Virtual phase CCD technology[J]. IEEE Electron Devices Meeting, 1979, 25: 611～614

[10] [10] N. S. Saks. A technique for suppressing dark current generated by interface states in buried channel CCD imagers[J]. IEEE Electron. Device Lett., 1980, 1(7): 131～133

[11] [11] Barry E. Buprke. Suppressing dark current in charge-coupled devices[P]. United States Patent 5008758

[12] [12] Paul R. Jorden, Peter Pool, Simon M. Tulloch. Secrets of E2V technologies CCDs (ex Marconi CCDs)[J]. Experimental Astronomy, 2002, 14(2): 69～75

[13] [13] Barry E. Burke, Stephanie A. Gajar. Dynamic suppression of interface-state dark current in buried-channel CCDs[J]. IEEE Trans. Electron. Devices, 1991, 38(2): 285～290

[14] [14] Dewitt G. Ong, R. F. Pieeret. Thermal carrier generation in charge-coupled devices[J]. IEEE Trans. Electron. Devices, 1975, 22(8): 593～602

[15] [15] Low-Light Technical Note 4: Dark Signal and Clock-Induced Charge in L3VisionTM CCD Sensors. http:∥www.e2vtechnologies.com/index.htm