Laser & Optoelectronics Progress, Volume. 58, Issue 7, 0718001(2021)

Analysis and Restriction About Accumulated Phase Error in Spacial Frequency-Domain Algorithm for White-Light Interferomety

Qinyuan Deng, Qingqing Huang*, Jie Hou, Yan Zhang, Fei Xiong, and Junhua Chen
Author Affiliations
  • School of Automation, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
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    Figures & Tables(16)
    Schematic of signal acquisition for white-light interferometry
    Schematic of traditional FDA algorithm
    Schematic of phase difference for discrete sampling interference signal analysis
    Schematic of ESAA
    Simulation sample and interferograms. (a) Original surface; (b) surface with a tilted dautm; (c) interferograms
    Simulation results. (a)(b) Surface topography and residual error measured by traditional FDA method; (c)(d) surface topography and residual error measured by ESAA method
    Comparison of cross-section profiles. (a) Traditional FDA method; (b) ESAA method
    Experiment setup
    Interferograms. (a) Grating structure; (b) spherical structure
    Grating structure measurement results. (a)(b) Surface topography containing the same inclined datum, measured by traditional FDA method and ESAA method; (c) inclined datum extracted from Fig. (b); (d)(e) surface topography after removing inclined datum from Fig. (a) and (b), respectively; (f) residual error between Fig. (d) and (e)
    Cross-section profile for grating structure. (a) Cross-section profile measured by traditional FDA method; (b) cross-section profile measured by ESAA method; (c) cross-section profile of residual error; (d) cross-section profile measured by stylus profiler
    Spherical structure measurement results. (a) Traditional FDA method; (b) ESAA method; (c) residual error between Fig. (a) and (b); (d)-(f) cross-section profiles of Fig. (a)-(c) at 250th row, respectively
    Measurement results after wavelet denoising. (a) Grating structure surface topography; (b) spherical structure surface topography; (c) cross-section profile of grating structure; (d) cross-section profile of spherical structure
    • Table 1. Residual analysis for two simulation results

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      Table 1. Residual analysis for two simulation results

      AlgorithmMean valueμPV valueΔStandard deviation σ
      FDA2.6×10-31.1000.290
      ESAA-7.2×10-50.0540.015
    • Table 2. Step height of grating structure

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      Table 2. Step height of grating structure

      MethodStep 1Step 2Step 3Step 4Average
      ESAA125.43134.69124.04126.21127.59
      Stylus profiler131.35129.32131.98131.99131.16
    • Table 3. Residual analysis for spherical structure

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      Table 3. Residual analysis for spherical structure

      Mean value PV value ΔStandard deviation σ
      -0.0970.970.18
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    Qinyuan Deng, Qingqing Huang, Jie Hou, Yan Zhang, Fei Xiong, Junhua Chen. Analysis and Restriction About Accumulated Phase Error in Spacial Frequency-Domain Algorithm for White-Light Interferomety[J]. Laser & Optoelectronics Progress, 2021, 58(7): 0718001

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    Paper Information

    Category: Microscopy

    Received: Aug. 17, 2020

    Accepted: Sep. 3, 2020

    Published Online: Apr. 25, 2021

    The Author Email: Huang Qingqing (qingq.huang@gmail.com)

    DOI:10.3788/LOP202158.0718001

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