Journal of Advanced Dielectrics, Volume. 14, Issue 3, 2343001(2024)
Probing atomic-scale structure of dielectric ceramics with scanning transmission electron microscopy
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Min Zhang, Rui Wei, Jinquan Zeng, Yuan-Hua Lin. Probing atomic-scale structure of dielectric ceramics with scanning transmission electron microscopy[J]. Journal of Advanced Dielectrics, 2024, 14(3): 2343001
Category: Research Articles
Received: Feb. 23, 2023
Accepted: Apr. 14, 2023
Published Online: Jul. 22, 2024
The Author Email: Lin Yuan-Hua (linyh@tsinghua.edu.cn)