Optical Instruments, Volume. 29, Issue 3, 80(2007)
Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties[J]. Optical Instruments, 2007, 29(3): 80
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