Optical Instruments, Volume. 29, Issue 3, 80(2007)
Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties[J]. Optical Instruments, 2007, 29(3): 80
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20