Chinese Journal of Quantum Electronics, Volume. 17, Issue 1, 81(2000)

The Influence of Ablation of Film Materials by Laser onZ-scan Measurement

[in Chinese]1 and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    During the measurement of optical nonlinearities of sample in the thin film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results. We analyze the positive and negative lens effect caused by the hole theoretically and give the expression of normalized transmittance in this condition.

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    [in Chinese], [in Chinese]. The Influence of Ablation of Film Materials by Laser onZ-scan Measurement[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 81

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    Paper Information

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    Received: Feb. 2, 1999

    Accepted: --

    Published Online: May. 15, 2006

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