Acta Photonica Sinica, Volume. 51, Issue 4, 0412007(2022)

Self-calibration Correction Measurement of Micro-angle Based on F-P Etalon Multi-beam Interference Imaging

Shinan ZHOU... Xiaoyan SHEN*, Dongsheng LI and Chenguang WU |Show fewer author(s)
Author Affiliations
  • College of Metrology & Measurement Engineering,China Jiliang University,Hangzhou 310018,China
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    Figures & Tables(8)
    Micro-angle measurement optical path based on F-P etalon[18]
    Self-calibration process schematic diagram of micro-angle measurement system
    The algorithm error simulation results of exact fraction method
    Simulation results of F-P etalon interval calculation error changing with temperature and humidity
    Micro-angle measuring device[18]
    Concentric interference rings corresponding to different wavelengths
    • Table 1. Different wavelength λj and its corresponding εj and k0j

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      Table 1. Different wavelength λj and its corresponding εj and k0j

      λ1 = 546.081 10 nmλ2 = 576.967 84 nmλ3 = 579.074 30 nm
      εj0.766 40.616 30.201 9
      Uεj0.010 20.009 90.009 5
      k0j7 3256 9336 908
    • Table 2. Comparison of micro-angle measurement results before and after self-calibration

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      Table 2. Comparison of micro-angle measurement results before and after self-calibration

      No.δ/μmsδ/μm

      Not self-calibrated

      f1=80 mm

      Upf1)/f1=0.361

      Self-calibrated but not corrected

      f2=78.178 mm

      Upf2)/f2=0.014

      Self-calibrated and corrected

      f '=78.540 mm

      Upf ')/f '=0.007

      α/(″)Upα)/(″)α/(″)Upα)/(″)α'/(″)Upα')/(″)
      0-10.1570.0120.2020.0410.2070.0410.2060.041
      0-20.2690.0120.3470.0410.3540.0410.3530.041
      0-30.2630.0120.3390.0410.3480.0410.3450.041
      1-176.9910.01499.2530.398101.5670.056101.0980.048
      1-277.1690.01399.4830.399101.8020.056101.3310.048
      1-377.2370.01299.5700.399101.8910.056101.4210.048
      2-1153.6550.014198.0850.755202.7010.071201.7660.055
      2-2153.6990.013198.1420.755202.7590.071201.8240.055
      2-3153.8060.013198.2800.756202.9000.071201.9640.055
      3-1230.2240.012296.7941.111303.7100.087302.3090.062
      3-2230.2910.012296.8801.111303.8000.087302.3970.062
      3-3230.4340.013297.0641.112303.9880.087302.5840.062
      4-1306.9010.012395.6411.468404.8630.102402.9930.069
      4-2306.9580.012395.7151.468404.9370.102403.0680.069
      4-3307.0990.011395.8961.469405.1230.102403.2530.069
      5-1383.5630.012494.4681.824505.9930.117503.6570.077
      5-2383.6110.012494.5301.825506.0570.117503.7200.077
      5-3383.8190.012494.7981.826506.3300.117503.9930.077
      6-1460.2290.012593.3002.181607.1280.132604.3250.084
      6-2460.3230.012593.4212.181607.2520.132604.4480.084
      6-3460.2970.012593.3882.181607.2170.132604.4140.084
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    Shinan ZHOU, Xiaoyan SHEN, Dongsheng LI, Chenguang WU. Self-calibration Correction Measurement of Micro-angle Based on F-P Etalon Multi-beam Interference Imaging[J]. Acta Photonica Sinica, 2022, 51(4): 0412007

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 28, 2021

    Accepted: Nov. 26, 2021

    Published Online: May. 18, 2022

    The Author Email: SHEN Xiaoyan (xyshen@cjlu.edu.cn)

    DOI:10.3788/gzxb20225104.0412007

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