Acta Photonica Sinica, Volume. 51, Issue 4, 0412007(2022)
Self-calibration Correction Measurement of Micro-angle Based on F-P Etalon Multi-beam Interference Imaging
Fig. 1. Micro-angle measurement optical path based on F-P etalon[18]
Fig. 2. Self-calibration process schematic diagram of micro-angle measurement system
Fig. 3. The algorithm error simulation results of exact fraction method
Fig. 4. Simulation results of F-P etalon interval calculation error changing with temperature and humidity
Fig. 6. Concentric interference rings corresponding to different wavelengths
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Shinan ZHOU, Xiaoyan SHEN, Dongsheng LI, Chenguang WU. Self-calibration Correction Measurement of Micro-angle Based on F-P Etalon Multi-beam Interference Imaging[J]. Acta Photonica Sinica, 2022, 51(4): 0412007
Category: Instrumentation, Measurement and Metrology
Received: Oct. 28, 2021
Accepted: Nov. 26, 2021
Published Online: May. 18, 2022
The Author Email: SHEN Xiaoyan (xyshen@cjlu.edu.cn)