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Chinese Optics Letters, Volume. 15, Issue 9, 091201(2017)

LS-SVM-based surface roughness prediction model for a reflective fiber optic sensor

Li Fu1、*, Jun Luo1, Weimin Chen1, Xueming Liu2, Dong Zhou1, Zhongling Zhang1, and Sheng Li1
Author Affiliations
  • 1Key Lab of Optoelectronic Technology & Systems of Ministry of Education, Chongqing University, Chongqing 400044, China
  • 25011 District Measurement Station of Weapon Industry, Chongqing 400050, China
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    Li Fu, Jun Luo, Weimin Chen, Xueming Liu, Dong Zhou, Zhongling Zhang, Sheng Li, "LS-SVM-based surface roughness prediction model for a reflective fiber optic sensor," Chin.Opt.Lett. 15, 091201 (2017)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Feb. 27, 2017

    Accepted: May. 25, 2017

    Published Online: Jul. 19, 2018

    The Author Email: Li Fu (310_fl@163.com)

    DOI:10.3788/COL201715.091201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology