Acta Optica Sinica, Volume. 39, Issue 10, 1012001(2019)
Improving Measurement Accuracy of Two-Dimensional S-Transform Profilometry
S-transform profilometry is a three-dimensional shape reconstruction method based on a lossless and reversible time-frequency technology. This method, a multiresolution technique, can reconstruct the three-dimensional shape of the tested object using the phase information demodulated from a single-shot fringe pattern. Herein, we analyze the factors that may affect the accuracy of S-transform profilometry. Piecewise-mean and curve-fitting methods are proposed to eliminate the background intensity of the fringe. In addition, adjusting factors are introduced into the S-transform kernel function to improve the time-frequency resolution. Simulation and experimental results verify that the proposed method exhibits high accuracy of three-dimensional shape reconstruction because of accurate S-transform coefficients.
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Mengqi Han, Wenjing Chen. Improving Measurement Accuracy of Two-Dimensional S-Transform Profilometry[J]. Acta Optica Sinica, 2019, 39(10): 1012001
Category: Instrumentation, Measurement and Metrology
Received: Apr. 26, 2019
Accepted: Jun. 10, 2019
Published Online: Oct. 9, 2019
The Author Email: Chen Wenjing (chenwj0409@scu.edu.cn)