Semiconductor Optoelectronics, Volume. 44, Issue 2, 319(2023)
Research on Faults Diagnosis of Board Chip Based on Infrared Images Series
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XIONG Meiming, HUANG Yifan, JIANG Ye, LIU Zhiyong, LIAO Guanglan. Research on Faults Diagnosis of Board Chip Based on Infrared Images Series[J]. Semiconductor Optoelectronics, 2023, 44(2): 319
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Received: Dec. 28, 2022
Accepted: --
Published Online: Aug. 14, 2023
The Author Email: Guanglan LIAO (guanglan.liao@hust.edu.cn)