Semiconductor Optoelectronics, Volume. 44, Issue 2, 319(2023)

Research on Faults Diagnosis of Board Chip Based on Infrared Images Series

XIONG Meiming... HUANG Yifan, JIANG Ye, LIU Zhiyong and LIAO Guanglan* |Show fewer author(s)
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    References(11)

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    XIONG Meiming, HUANG Yifan, JIANG Ye, LIU Zhiyong, LIAO Guanglan. Research on Faults Diagnosis of Board Chip Based on Infrared Images Series[J]. Semiconductor Optoelectronics, 2023, 44(2): 319

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    Paper Information

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    Received: Dec. 28, 2022

    Accepted: --

    Published Online: Aug. 14, 2023

    The Author Email: Guanglan LIAO (guanglan.liao@hust.edu.cn)

    DOI:10.16818/j.issn1001-5868.2022122802

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