Acta Photonica Sinica, Volume. 53, Issue 1, 0112003(2024)

Research on Large Field-of-view White Light Interferometry Measurement System and Performance

Tao LIU1... Zhibin WANG1, Jiaqi HU1, Yaonan HE1, Weichang JING1, Enjing CHEN2, Wenlong ZHOU3, Guoming YU1, Ning YANG4, Di ZHAO4, Guofeng ZHANG1 and Shuming YANG1,* |Show fewer author(s)
Author Affiliations
  • 1School of Mechanical Engineering,Xi'an Jiaotong University,Xi'an 710049,China
  • 2Ostar-optical Micro-nano Optoelectronics Co.,Ltd.,Xi'an 710077,China
  • 3Motic China Group Co.,Ltd.,Xiamen 361006,China
  • 4National Market Supervision Key Laboratory of Measurement Optics and Applications,Shaanxi Institute of Metrology Science,Xi'an 710100,China
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    Figures & Tables(18)
    Schematic of the optical path of large field-of-view WLI system
    Measured spectral curve for the white LED source
    Simulated distribution curve of white light interference signal before and after filtering
    Actual raw interference signal for the white LED source at a certain position
    Actual white light interference signal with different spectral filters
    Apparatus of large field-of-view white light interferometer
    Field-of-view at the object side
    Test of the lateral resolution
    Photo of the standard step sample
    Measurement result of the standard step 1
    Measurement result of the standard step 2
    Test of the reticle
    Test of the MEMS structure
    Test of the SiO2 film on a Si wafer
    • Table 1. Basic parameters of the customized bandpass filters

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      Table 1. Basic parameters of the customized bandpass filters

      ParametersGroup 1Group 2Group 3Group 4
      Center wavelength/nm540550585600
      Bandwidth/nm80100170240
    • Table 2. Test of the effective lateral magnification

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      Table 2. Test of the effective lateral magnification

      PointsDirection 1Direction 2Direction 3Direction 4
      10.950.940.940.94
      20.940.940.940.94
      30.940.940.940.94
      40.940.940.940.94
      50.940.940.940.94
      60.940.940.940.94
      70.940.940.940.94
      80.940.940.950.94
      90.940.940.950.95
      100.950.950.950.95
    • Table 3. Ten repeated measurement results of the standard step sample

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      Table 3. Ten repeated measurement results of the standard step sample

      Number12345678910AverageStandard deviation
      Step 12.0522.0442.0332.0322.0482.0342.0622.0392.0562.0632.0460.012
      Step 220.45420.44920.47420.45520.50220.48320.46120.46620.45920.47220.4680.016
    • Table 4. Film thickness measurement results of the central fraction

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      Table 4. Film thickness measurement results of the central fraction

      X direction
      Y direction1.040.970.970.970.971.05
      1.041.050.970.960.971.05
      1.041.051.040.961.051.13
      1.041.041.050.960.961.04
      1.041.041.041.051.051.05
      1.041.041.041.041.041.04
      1.041.041.041.041.041.04
      1.041.041.041.041.041.04
      1.041.031.031.031.041.05
      1.041.041.041.031.041.04
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    Tao LIU, Zhibin WANG, Jiaqi HU, Yaonan HE, Weichang JING, Enjing CHEN, Wenlong ZHOU, Guoming YU, Ning YANG, Di ZHAO, Guofeng ZHANG, Shuming YANG. Research on Large Field-of-view White Light Interferometry Measurement System and Performance[J]. Acta Photonica Sinica, 2024, 53(1): 0112003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 8, 2023

    Accepted: Nov. 28, 2023

    Published Online: Feb. 1, 2024

    The Author Email: YANG Shuming (shuming.yang@xjtu.edu.cn)

    DOI:10.3788/gzxb20245301.0112003

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