Infrared and Laser Engineering, Volume. 49, Issue 2, 213004(2020)

Measurement method of glass thickness and refractive index based on spectral interference technology

Zhao Yuanyuan1、*, Xiao Zuojiang1, and Liang Xu2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Zhao Yuanyuan, Xiao Zuojiang, Liang Xu. Measurement method of glass thickness and refractive index based on spectral interference technology[J]. Infrared and Laser Engineering, 2020, 49(2): 213004

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: 光电测量

    Received: Oct. 5, 2019

    Accepted: Nov. 25, 2019

    Published Online: Mar. 10, 2020

    The Author Email: Yuanyuan Zhao (1792166418@qq.com)

    DOI:10.3788/irla202049.0213004

    Topics