Infrared and Laser Engineering, Volume. 50, Issue 12, 20210196(2021)

Measurement of optical axis eccentricity of a large-aperture concave ellipsoid mirror

Chao Zhang1...2, Hui Xing2, Junru Song2, Junhua Yan1, Kai Zhang2, Chongyang Li2, Zhiyuan Liu2 and Zhongrui Jin2 |Show fewer author(s)
Author Affiliations
  • 1Academy of Astronautics, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China
  • 2Key Laboratory for Advanced Optical Remote Sensing Technology of Beijing, Beijing Institute of Space Mechanics & Electricity, Beijing 100094, China
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    Figures & Tables(14)
    Eccentricity of the ellipsoid
    Establishing the measuring coordinate system ∑0
    Primary mirror under test
    Optical model of test
    Relationship between misalignment variables and aberrations of the primary mirror
    Relationship between misalignment variables and aberrations of the flat crystal
    Light path of the test
    Test of the line eccentricity
    • Table 1. Zernike polynominal expressions of circular domain

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      Table 1. Zernike polynominal expressions of circular domain

      Term #Polynominal expressionMeaningBrief exp.
      5${\rho ^2}\cos 2\theta $Astigmatism 0° or 90°Z5
      6${\rho ^2}\sin 2\theta $Astigmatism ±45°Z6
      7$(3{\rho ^2} - 2)\rho \cos \theta $X coma and tilt Z7
      8$(3{\rho ^2} - 2)\rho \sin \theta $Y coma and tilt Z8
      9$6{\rho ^4} - 6{\rho ^2} + 1$Spherical and focusZ9
    • Table 2. Design results of the optical system

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      Table 2. Design results of the optical system

      Optical elementVertex radius of curvature/mmKMirror spacing or thickness/mmEffective light aperture/mmMaterials
      Primary mirror−3042.54−0.9727−1430.001070.00ULE
      Optical flat−28.0066.45K9
      −78.7853.38
    • Table 3. Aberration of the system(λ=632.8 nm)

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      Table 3. Aberration of the system(λ=632.8 nm)

      Zernike coefficient (λ) RMS(λ) Interferogram
      Z5Z6Z7Z8Z9
      Before spherical aberration compensation00005.32.4
      After the spherical aberration is compensated000000
    • Table 4. Sensitivity matrix

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      Table 4. Sensitivity matrix

      Z5Z6Z7Z8Z9
      ${T_{\alpha 1}}$0001490
      ${T_{\alpha 2}}$00020
    • Table 5. System aberration (λ=632.8 nm)

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      Table 5. System aberration (λ=632.8 nm)

      Zernike coefficient(λ) RMS(λ)
      Z5Z6Z7Z8Z90.048
      −0.020.00−0.020.030.04
      Fringe patternInterference pattern
    • Table 6. Test result of the angle

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      Table 6. Test result of the angle

      Normal of a plane mirror Normal of primary mirror back
      Space angle/(°)(0, 90.00321)(0.00125, 90.01324)
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    Chao Zhang, Hui Xing, Junru Song, Junhua Yan, Kai Zhang, Chongyang Li, Zhiyuan Liu, Zhongrui Jin. Measurement of optical axis eccentricity of a large-aperture concave ellipsoid mirror[J]. Infrared and Laser Engineering, 2021, 50(12): 20210196

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    Paper Information

    Category: Photoelectric measurement

    Received: Mar. 26, 2021

    Accepted: --

    Published Online: Feb. 9, 2022

    The Author Email:

    DOI:10.3788/IRLA20210196

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