High Power Laser and Particle Beams, Volume. 36, Issue 6, 061002(2024)
Evaluation of reliability improvement effect on laser adaptive optics systems
Figures & Tables(16)
Fig. 7. Fault tree of detection function depending on the wavefront processing module
Fig. 11. Failure probability time curve of improved AO control system
Fig. 12. Comparison of failure probability-time curve of AO system before and after improvement
Table 1. AO system basic fault tree events table
View tableView in ArticleTable 1. AO system basic fault tree events table
event failure event meaning failure rate/h−1 event failure event meaning failure rate/h−1 T1 classical AO system failure X4 beam clean wavefront processing failure 2×10−5 M1 failure of wavefront control subsystem X5 beam stabilization high-voltage drive failure 1.5×10−5 M2 failure of monitoring and recording subsystem X6 beam clean high-voltage drive failure 1.5×10−5 M3 communication subsystem failure X7 beam stabilization tilt mirror failure 2×10−3 M4 power subsystem failure X8 beam clean deformable mirror failure 2×10−3 M5 wavefront detection module failure X9 monitoring control module failure 1×10−5 M6 wavefront processing module failure X10 failure of data recording module 1×10−5 M7 wavefront control module failure X11 main control network failure 1×10−5 M8 wavefront correction module failure X12 electric control network failure 1×10−5 X1 beam stabilization wavefront detection failure 1×10−5 X13 program control power supply failure 1×10−5 X2 beam clean wavefront detection failure 1×10−5 X14 total power failure 1×10−5 X3 beam stabilization wavefront processing failure 2×10−5
Table 2. Added event table of improved AO system DFT
View tableView in ArticleTable 2. Added event table of improved AO system DFT
event failure event meaning failure rate/h−1 event failure event meaning failure rate/h−1 T2 AO system failure with reliability improvement measures M15 mirror monitoring and warning failure 1×10−2 M9 power supply module failure X15 UPS failure 2×10−3 M10 sensor detection failure X15 UPS spare failure 1×10−5 M11 high voltage protection failure X16 image slope effectiveness monitoring failure 1×10−2 M12 high pressure drive failure X17 voltage instability monitoring failure 1×10−2 M13 active mirror protection failure X18 hardware protection network failure 1.5×10−5 M14 active mirror failure X19 air knife failure 1.5×10−3
Table 3. Event importance table of improved AO system DFT
View tableView in ArticleTable 3. Event importance table of improved AO system DFT
event Is Ip Ic X1 2-12 0.5797 0.0160 X2 2-12 0.5797 0.0160 X3 2-10 0.9070 0.0499 X4 2-10 0.9070 0.0499 X5 2-12 0.0014 5.9110×10−5 X6 2-12 0.0014 5.9110×10−5 X7 2-12 0.0335 0.1429 X8 2-12 0.0335 0.1429 X9 2-10 0.9046 0.0249 X10 2-10 0.9046 0.0249 X11 2-10 0.9046 0.0249 X12 2-10 0.9046 0.0249 X13 2-10 0.9046 0.0249 X14 2-11 0.0016 4.4057×10−5 X15 2-11 1.4412×10−6 6.1455×10−6 X15 2-11 0.0012 3.3525×10−5 X16 2-11 0.0072 0.0682 X17 2-12 2.2341×10−5 2.1297×10−4 X18 2-12 0.0029 1.1873×10−4 X19 2-12 0.2281 0.7762 M15 2-12 0.1511 1.4403
Table 4. Test record of beam stabilization and clean system
View tableView in ArticleTable 4. Test record of beam stabilization and clean system
time for one experiment/s times during experiments/time total time/ (s·time) 0.5 24 184 1 22 2 1 3 6 5 5 10 3 15 1 30 2
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Qiwang Jia, Xinyang Li, Xi Luo, Yongdong Gan, Ruihao Ma, Yue Mei, [in Chinese]. Evaluation of reliability improvement effect on laser adaptive optics systems[J]. High Power Laser and Particle Beams, 2024, 36(6): 061002
Paper Information
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Received: Dec. 14, 2023
Accepted: Mar. 13, 2024
Published Online: Jun. 3, 2024
The Author Email: Li Xinyang (xyli@ioe.ac.cn)
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