Infrared and Laser Engineering, Volume. 51, Issue 4, 20210337(2022)
Thermal damage of infrared focal plane detector Dewar and its environmental test
Figures & Tables(8)
Fig. 2. Structure and technology of infrared focal plane detector Dewar assembly
Table 1. Main failure modes of thermorunaway of infrared detectors[8]
View tableView in ArticleTable 1. Main failure modes of thermorunaway of infrared detectors[8]
Part Phase Failure mode Acceleration factor IDDCA Cooler Storage Leakage Hot temperature Temperature cycles Qutgassing Hot temperature Operational Bearings and moving parts wear or break FPA temperature High ambient temperature Dewar heat load DDA Vacuum Storage Leakage Temperature cycles Hot temperature Operational Qutgassing Temperature cycles Hot temperature Connections Storage Bondings aging Hot temperature Operational Bondings break Temperature cycles FPA Storage Diodes degradations (increase of defective pixels) Hot temperature Operational Loss of connections (increase of defective pixels) Number of cooldown cycles
Table 2. Procedure of infrared detector temperature environment test
View tableView in ArticleTable 2. Procedure of infrared detector temperature environment test
Category Test procedure Standard Temperature extremes Test duration Transfer time Storage test High temperatures or low temperatures Constant temperature storage GJB 1788—1993 +40-+70 ℃ 0-−62 ℃ 24-168 h 24-120 h — GJB 2345—1995 +70 ℃ −60 ℃ 72 h 72 h — MIL−D−49172A +71 ℃，−54 ℃ — — SOFRADIR +71 ℃ −54 ℃ 1500 h 6 months — GJB 5244—2004 GJB 7247—2011 GJB 5029A—2015 GJB 6791—2009 GJB 150.3—1986 +70 ℃ −55 ℃ 48 h 24 h — GJB 150.3A—2009 +71 ℃，−54 ℃ — ≤3 ℃/min Temperature shock test High temperatures or low temperatures. Constant temperature shock GJB 1788—1993 +40-+85 ℃ −10-−62 ℃ 0.5 h 1.2 h <5 min，3 or 5 cycles GJB 2345—1995 +70 ℃，−55 ℃ 12 h <5 min，3 cycles MIL-D-49172A SOFRADIR +71 ℃，−54 ℃ — — GJB 5244—2004 GJB 7247—2011 +70 ℃，−55 ℃ — <5 min，5 cycles GJB 150.5—1986 MIL-STD-810C +70 ℃，−55 ℃ 1 h 5 min，3 cycles GJB 150.5A—2009 MIL-STD-810F +71 ℃，−54 ℃ — 1 min，≥3 cycles
Table 3. Test magnitude and duration of the trouble-free temperature environmental test
View tableView in ArticleTable 3. Test magnitude and duration of the trouble-free temperature environmental test
Temperature extremes/℃ Test duration Transfer time Environmental tests Temperature storage +71 72 h − −54 72 h − Temperature shock +71 1 h 1 min, ≥5 cycles −54 1 h Reliability tests Temperature cycles +71 1 h ≥10 ℃/min, 12 cycles −54 1 h +71 30 min ≥30 ℃/min, 50 or 100 cycles −193 30 min Temperature storage +71 1500 h − −54 6 months − Accelerated degradation test[ 13 ]+90 2160 h −
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Jianlin Li, Zhuolin Liu, Xiaoyan Chen, Yongchang Lei, Wei Dong, Kunlun Qian. Thermal damage of infrared focal plane detector Dewar and its environmental test[J]. Infrared and Laser Engineering, 2022, 51(4): 20210337
Paper Information
Category: Special issue—Infrared detection and recognition technology under superspeed flow field
Received: May. 26, 2021
Accepted: --
Published Online: May. 18, 2022
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