Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System

Shuanglu Zou; Wanrong Gao; Siyu Liu

doi:10.3788/LOP202259.1617003

Laser & Optoelectronics Progress, Volume. 59, Issue 16, 1617003(2022)

Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System

Shuanglu Zou, Wanrong Gao^*, and Siyu Liu

Author Affiliations

School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China

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Figures & Tables(5)

Fig. 1. Schematic of the PS-FFOCT system

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Fig. 2. Intensity envelope of the interferogram from a mirror in the sample arm

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Fig. 3. Image of USAF1951 resolution test chart

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Fig. 4. $t a n^{2} ϕ_{B}^{’} / t a n^{2} ϕ_{B}$ image without error

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Fig. 5. $t a n^{2} ϕ_{B}^{’} / t a n^{2} ϕ_{B}$ image with error

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Shuanglu Zou, Wanrong Gao, Siyu Liu. Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System[J]. Laser & Optoelectronics Progress, 2022, 59(16): 1617003

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Paper Information

Category: Medical Optics and Biotechnology

Received: Aug. 13, 2021

Accepted: Aug. 27, 2021

Published Online: Aug. 8, 2022

The Author Email: Gao Wanrong (wgao@njust.edu)

DOI:10.3788/LOP202259.1617003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology