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Opto-Electronic Engineering, Volume. 32, Issue 6, 76(2005)

[in Chinese]

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[2] [2] ORLANDO Tobias,RUI Seara. Image segmentation by histogram thresholding using fuzzy sets[J]. Transactions on Image Processing,IEEE,2002,11(12):1457-1465.

[3] [3] Jui-cheng YEN,Fu-juay CHANG,Shyang CHANG. A new criterion for automatic multilevel thresholding[J]. Transactions on Image Processing,IEEE,1995,4(3):370-378.

CLP Journals

[1] Wang Yanfeng, Jia Shuhai. Hybrid Phase Unwrapping Algorithm Based on Modulation Analysis and Second-Order Derivative Guide[J]. Laser & Optoelectronics Progress, 2011, 48(4): 41002

[2] FU Hui, WU Bin, ZHANG Hongying, XU Jin. Fast Image Dehazing Based on Dark-chanel Physical Model[J]. Opto-Electronic Engineering, 2016, 43(2): 82

[3] Li Sikun, Su Xianyu, Chen Wenjing. Analytic Image Based Wavelet Transform Method for Phase Reconstruction of Optical Interferogram with Linear-Carrier[J]. Chinese Journal of Lasers, 2011, 38(2): 209002

[4] Li Sikun, Su Xianyu, Chen Wenjing. A New Wavelet Transform Method for Optical Carrier-Fringe Pattern Phase Reconstruction[J]. Chinese Journal of Lasers, 2010, 37(12): 3060

[5] LI Zongnan, ZHU Dan, TONG Xinxin. An Improved Error-diffusion Algorithm for Projector Defocusing Profilometry[J]. Opto-Electronic Engineering, 2016, 43(12): 34

[6] LIU Ying, ZHANG Ruifeng, CHEN Xiangzhou, LI Qiang, JI Xin, WANG Yang. A Region-growing Phase Unwrapping Algorithm Based on a New Quality-guided Map[J]. Opto-Electronic Engineering, 2016, 43(1): 36

[7] Li Yong, Mao Lei, Zhang Haijun, Ma Lihong, Wang Hui. Fast Phase Unwrapping Based on Nonlinear Look-up Table in Digital Holographic Microscopy[J]. Chinese Journal of Lasers, 2014, 41(2): 209025

[8] Chen Lijuan, Xu Lihua. Fourier Transform Profilometry for Surface with Specular Reflection[J]. Acta Optica Sinica, 2010, 30(5): 1349

[9] Man Yuchun, Zhang Zhongyu, Li Ruigang, Zhang Xuejun. Research on Filtering Method of Phase Shifting Digital Moiré Patterns[J]. Laser & Optoelectronics Progress, 2011, 48(5): 51001

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Paper Information

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Received: Dec. 7, 2004

Accepted: --

Published Online: Nov. 14, 2007

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Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology