Chinese Optics Letters, Volume. 7, Issue 1, 0188(2009)

Measurement of bidirectional reflection distribution function on material surface

Wei Zhang, Hongyuan Wang, and Zhile Wang
Author Affiliations
  • Research Center for Space Optical Engineering, Harbin Institute of Technology, Harbin 150001
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    References(11)

    [1] [1] H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

    [2] [2] R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

    [4] [4] P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).

    [5] [5] G. J. Ward, Comput. Graph. 26, 265 (1992).

    [6] [6] Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

    [7] [7] A. Ryer, The Light Measurement Handbook (International Light, Newburyport, 1998) p.1.

    [10] [10] S. C. Foo, "A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation" (Master’s Thesis, Cornell University, 1997) p.1.

    [11] [11] L. Ke, "A method of light reflectance measurement" (Master’s Thesis, University of British Columbia, 1999) p.1.

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    Wei Zhang, Hongyuan Wang, Zhile Wang. Measurement of bidirectional reflection distribution function on material surface[J]. Chinese Optics Letters, 2009, 7(1): 0188

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    Paper Information

    Received: May. 5, 2008

    Accepted: --

    Published Online: Mar. 4, 2009

    The Author Email:

    DOI:10.3788/COL20090701.0088

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