Spectroscopy and Spectral Analysis, Volume. 31, Issue 3, 831(2011)
Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement
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HU Guang-chun, ZHANG Wei-guang. Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2011, 31(3): 831
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