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Spectroscopy and Spectral Analysis, Volume. 31, Issue 3, 831(2011)

Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement

HU Guang-chun* and ZHANG Wei-guang
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    HU Guang-chun, ZHANG Wei-guang. Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2011, 31(3): 831

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    Paper Information

    Received: May. 10, 2010

    Accepted: --

    Published Online: Aug. 16, 2011

    The Author Email: Guang-chun HU (hugc_caep@sina.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology